Sessions  

Wednesday, 7 July 2010

    Plenary Session (09:00, Room 1)
    Electronics (11:30, Room 1)
    Analytics I (11:30, Room 2)
    Materials/composites III (13:40, Room 1)
    Analytics II (13:40, Room 2)
    Plenary session (15:40, Room 1)

 

10:30, Room 2  

Analytics I

11:30





12:00



12:20




12:40
  Electron microscopy and holography of nanobricks of Si and Ge clathrates
Paul Simon et al.
Max Planck Institute for Chemical Physics of Solids, Dresden, Germany

NFFA: nanoscience foundries and fine analysis
Giorgio Rossi et al.
CNR-INFM Laboratorio Nazionale TASC, Trieste, Italy

SARFUS: access to the nanoworld simply with a standard optical microscope
Rémi Corso
NANOLANE, Montfort-le-Gesnois, France

Lunch break with technical exhibition
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