Nanofair 2010
> Program > Analytics II (13:40, Room 2)
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| Sessions |
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Wednesday, 7 July 2010
Plenary Session (09:00, Room 1)
Electronics (11:30, Room 1)
Analytics I (11:30, Room 2)
Materials/composites III (13:40, Room 1)
Analytics II (13:40, Room 2)
Plenary session (15:40, Room 1)
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| 13:10, Room 2 |
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Analytics II
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13:40
14:10
14:30
14:50
15:10 |
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Nanomaterials and nanoanalysis for hydrogen solid state storage
Lars Röntzsch et al. (invited)
Fraunhofer Institute for Manufacturing and Advanced Materials (IFAM), Dresden, Germany
Quantitative Kelvin probe force microscopy on semiconductors under ambient conditions
Christine Baumgart et al.
Forschungszentrum Dresden-Rossendorf, Dresden, Germany
Qualitative and quantitative analysis of nanotechnological material with scanning Auger microscopy
Andrey Lyapin et al.
Physical Electronics GmbH, Ismaning, Germany
Ultratrace element analysis of nanoparticles by total reflection X-ray fluorescence spectrometry
Armin Gross et al.
Bruker Nano GmbH, Berlin, Germany
Coffee break with technical exhibition |
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